Lockheed Martin Aeronautics Company worked with Exact Metrology to conduct a proof of concept to determine if non-contact metrology scanning solutions could be used to digitize this fit check. This presentation will discuss the proof of concept in detail, including results obtained with the Surphaser 75USR and the preliminary path forward.
- Understand importance of fit checks during the manufacturing process
- Identify the advantages of using non-contact metrology for digital interference checks instead of physical tooling
- Define other application areas for digital interference checks